A Thermal Measurement System for Nano-meter Scale Area Evaluation

Kastuhiro Tanaka, Sumito Nagasawa, Takahito Ono, Hiroki Kuwano

Research output: Contribution to journal › Article › peer-review

Original language	English
Pages (from-to)	337
Journal	Abstract Book of The International Conference on Nanoscience and Technology (ICN+T2006)
Publication status	Published - 2006 Apr 1

Cite this

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title = "A Thermal Measurement System for Nano-meter Scale Area Evaluation",

author = "Kastuhiro Tanaka and Sumito Nagasawa and Takahito Ono and Hiroki Kuwano",

year = "2006",

month = apr,

day = "1",

language = "English",

pages = "337",

journal = "Abstract Book of The International Conference on Nanoscience and Technology (ICN+T2006)",

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TY - JOUR

T1 - A Thermal Measurement System for Nano-meter Scale Area Evaluation

AU - Tanaka, Kastuhiro

AU - Nagasawa, Sumito

AU - Ono, Takahito

AU - Kuwano, Hiroki

PY - 2006/4/1

Y1 - 2006/4/1

M3 - Article

SP - 337

JO - Abstract Book of The International Conference on Nanoscience and Technology (ICN+T2006)

JF - Abstract Book of The International Conference on Nanoscience and Technology (ICN+T2006)

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