An algorithm for sensing coverage problem in tireless sensor networks

Vinh Tran Quang, Takumi Miyoshi

Research output: Chapter in Book/Report/Conference proceedingConference contribution

14 Citations (Scopus)


Wireless sensor networks (WSNs) have been widely studied and usefully employed in many applications such as monitoring environment, embedded system and so on. In WSNs, substantial nodes are deployed randomly over the entire desired area; therefore, the sensing regions of different nodes may be partially overlapped. This is referred to as the sensing coverage problem. In this paper we first define a maximum sensing coverage region problem (MSCR) in WSNs and then solve the problem by the proposed algorithm. In our method, the maximum monitored area fully covered by a minimum active sensors. The main design features are: selecting a small number of delegated sensor nodes by identifying and removing redundant nodes in high-density networks and assigning them an off-duty operation while guarantees the whole area is k-covered, to make sure all events occurred in that area can be accurately and timely detected. We apply the proposed algorithm to improve LEACH, a hierarchical protocol for WSNs and develop a simulation program to evaluate the performance of the algorithm.

Original languageEnglish
Title of host publicationProceedings of the 2008 IEEE Sarnoff Symposium, SARNOFF
Publication statusPublished - 2008
Event2008 IEEE Sarnoff Symposium, SARNOFF - Princeton, NJ, United States
Duration: 2008 Apr 282008 Apr 30

Publication series

NameProceedings of the 2008 IEEE Sarnoff Symposium, SARNOFF


Conference2008 IEEE Sarnoff Symposium, SARNOFF
Country/TerritoryUnited States
CityPrinceton, NJ


  • Algorithm
  • Energy-efficiency
  • Routing protocol
  • Sensing coverage
  • Wireless sensor networks

ASJC Scopus subject areas

  • Electrical and Electronic Engineering


Dive into the research topics of 'An algorithm for sensing coverage problem in tireless sensor networks'. Together they form a unique fingerprint.

Cite this