An approach for measurements of optical constants for molten Sb2Te3 by spectroscopic ellipsometer

Masashi Kuwahara; Toshio Fukaya; Rie Endo; Masahiro Susa; Kouichi Tsutsumi; Michio Suzuki; Fukuyoshi Morikasa; Tomoyoshi Endo; Toshiyasu Tadokoro

doi:10.1364/isom_ods.2011.ome3

An approach for measurements of optical constants for molten Sb₂Te₃ by spectroscopic ellipsometer

Masashi Kuwahara, Toshio Fukaya, Rie Endo, Masahiro Susa, Kouichi Tsutsumi, Michio Suzuki, Fukuyoshi Morikasa, Tomoyoshi Endo, Toshiyasu Tadokoro

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

We have succeeded in measuring optical constants of molten Sb₂Te₃ wavelength range from 350 to 1000 nm using a novel system consisting of a spectroscopic ellipsometer and an infrared heating system.

Original language	English
Title of host publication	Joint International Symposium on Optical Memory and Optical Data Storage, ISOM_ODS 2011
Publisher	Optical Society of America (OSA)
ISBN (Print)	9781557529152
DOIs	https://doi.org/10.1364/isom_ods.2011.ome3
Publication status	Published - 2011
Externally published	Yes
Event	Joint International Symposium on Optical Memory and Optical Data Storage, ISOM_ODS 2011 - Kauai, HI, United States Duration: 2011 Jul 17 → 2011 Jul 20

Publication series

Name	Optics InfoBase Conference Papers
ISSN (Electronic)	2162-2701

Conference

Conference	Joint International Symposium on Optical Memory and Optical Data Storage, ISOM_ODS 2011
Country/Territory	United States
City	Kauai, HI
Period	11/7/17 → 11/7/20

ASJC Scopus subject areas

Instrumentation
Atomic and Molecular Physics, and Optics

Access to Document

10.1364/isom_ods.2011.ome3

Cite this

Kuwahara, M., Fukaya, T., Endo, R., Susa, M., Tsutsumi, K., Suzuki, M., Morikasa, F., Endo, T., & Tadokoro, T. (2011). An approach for measurements of optical constants for molten Sb₂Te₃ by spectroscopic ellipsometer. In Joint International Symposium on Optical Memory and Optical Data Storage, ISOM_ODS 2011 (Optics InfoBase Conference Papers). Optical Society of America (OSA). https://doi.org/10.1364/isom_ods.2011.ome3

An approach for measurements of optical constants for molten Sb₂Te₃ by spectroscopic ellipsometer. / Kuwahara, Masashi; Fukaya, Toshio; Endo, Rie et al.

Joint International Symposium on Optical Memory and Optical Data Storage, ISOM_ODS 2011. Optical Society of America (OSA), 2011. (Optics InfoBase Conference Papers).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Kuwahara, M, Fukaya, T, Endo, R, Susa, M, Tsutsumi, K, Suzuki, M, Morikasa, F, Endo, T & Tadokoro, T 2011, An approach for measurements of optical constants for molten Sb₂Te₃ by spectroscopic ellipsometer. in Joint International Symposium on Optical Memory and Optical Data Storage, ISOM_ODS 2011. Optics InfoBase Conference Papers, Optical Society of America (OSA), Joint International Symposium on Optical Memory and Optical Data Storage, ISOM_ODS 2011, Kauai, HI, United States, 11/7/17. https://doi.org/10.1364/isom_ods.2011.ome3

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abstract = "We have succeeded in measuring optical constants of molten Sb2Te3 wavelength range from 350 to 1000 nm using a novel system consisting of a spectroscopic ellipsometer and an infrared heating system.",

author = "Masashi Kuwahara and Toshio Fukaya and Rie Endo and Masahiro Susa and Kouichi Tsutsumi and Michio Suzuki and Fukuyoshi Morikasa and Tomoyoshi Endo and Toshiyasu Tadokoro",

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AU - Suzuki, Michio

AU - Morikasa, Fukuyoshi

AU - Endo, Tomoyoshi

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