Original language | English |
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Pages (from-to) | 325-330 |
Journal | Proc. of VSTech 2005 |
Volume | 227 |
Publication status | Published - 2005 Jun 1 |
Analysis of influence that strong magnetic field environment causes to noise measurement system
Kenji Muto, Kazuo Yagi, Kentaro Eguchi, Kunihiko Takano
Research output: Contribution to journal › Article › peer-review