| Original language | English |
|---|---|
| Pages (from-to) | 277-279 |
| Journal | IEEE Electron Device Lett. |
| Volume | 16 |
| Publication status | Published - 1995 Jun 1 |
Analysis of Kink-Related Backgating Effect in GaAs NESFET
K.Horio K.Horio, K.Usami K.Usami, Kazushige Horio
Research output: Contribution to journal › Article › peer-review
2
Citations
(Scopus)