Analysis of trap-parameter dependence of lag phenomena and current collapse in GaN FETs

H. Takayanagi, H. Nakano, K. Itagaki, K. Horio

Research output: Contribution to journalArticlepeer-review

Original languageEnglish
Pages (from-to)1062-1063
JournalExtended abstracts of 2005 International Conference on Solid State Devices and Materials (SSDM 2005), Kobe, Japan
Publication statusPublished - 2005 Sept 15

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