Original language | English |
---|---|
Pages (from-to) | 8073-8079 |
Journal | The American Physical Society |
Volume | 46 |
Publication status | Published - 1992 Oct 1 |
Characterization od ClOx radicals in vacuum-ultraviolet-irradiated high-purity silica
H. Nishikawa, R. Nakamura, Y. Ohki, K. Nagasawa, Y. Hama
Research output: Contribution to journal › Article › peer-review
15
Citations
(Scopus)