Characterization of nano-composite M-2411/Y-123 thin films by electron backscatter diffraction and in-field critical current measurements

M. A. Bodea, J. D. Pedarnig, T. D. Withnell, H. W. Weber, D. A. Cardwell, N. Hari Babu, A. Koblischka-Veneva

Research output: Contribution to journal › Article › peer-review

3 Citations (Scopus)

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Physics & Astronomy