Characterization of on-chip capacitance effects for I/O circuits and core circuits

Toshio Sudo, Ken Nakano, Junichi Kudo, Satoru Haga

Research output: Contribution to conferencePaperpeer-review

9 Citations (Scopus)

Fingerprint

Dive into the research topics of 'Characterization of on-chip capacitance effects for I/O circuits and core circuits'. Together they form a unique fingerprint.

Engineering & Materials Science