Chip-level performance maximization using ASIS (application-specific interconnect structure) wiring design concept for 45 nm CMOS generation

Noriaki Oda, Hironori Imura, Naoyoshi Kawahara, Masayoshi Tagami, Hiroyuki Kunishima, Shuji Sone, Sadayuki Ohnishi, Kenta Yamada, Yumi Kakuhara, Makoto Sekine, Yoshihiro Hayashi, Kazuyoshi Ueno

Research output: Contribution to journalArticlepeer-review

5 Citations (Scopus)

Fingerprint

Dive into the research topics of 'Chip-level performance maximization using ASIS (application-specific interconnect structure) wiring design concept for 45 nm CMOS generation'. Together they form a unique fingerprint.

Engineering & Materials Science

Chemical Compounds