Computer-Aided Analysis of GaAs n-i-n Structures with a Heavily Compensated i-Layer

Kazushige Horio, Hisayoshi Yanai, Toshiaki Ikoma

Research output: Contribution to journalArticlepeer-review

6 Citations (Scopus)


Current-voltage characteristics and space-charge distributions in an n-i-n structure have been numerically analyzed and compared with Lampert's theory. It is found that an effective resistivity in the low-voltage region depends on acceptor and trap densities and the length of an i-layer. The analytical model has been presented to intimate the effective resistivity and the onset voltage for current rise. The back-gating effect also has been analyzed in terms of a separation distance between devices and an acceptor density. To achieve a good Isolation between two devices in GaAs IC's, it is suggested that a sha low acceptor density as well as a trap density must be larger than a critical value.

Original languageEnglish
Pages (from-to)1242-1250
Number of pages9
JournalIEEE Transactions on Electron Devices
Issue number9
Publication statusPublished - 1986 Sept

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Electrical and Electronic Engineering


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