Computer simulation of point-defect fields and microdefect patterns in Czochralski-grown Si crystals

Nikolai I. Puzanov, Anna M. Eidenzon, Dmitri N. Puzanov, Jun Furukawa, Kazuhiro Harada, Naoki Ono, Yasushi Shimanuki

Research output: Contribution to journalArticlepeer-review

2 Citations (Scopus)


Computer simulation of the point-defect fields in Czochralski Si crystals is reported. Our model includes the following factors: for crystals, variable pull rate V(t), the lagging of crystallization rate Ṽ behind V, crystal length increasing with time l(t), temperature field T(r, z) dependent on l or Ṽ, and actual shape of the crystal-melt interface; for native point defects, transport with the moving crystal, Fickian diffusion and thermodiffusion, the vacancy-self-interstitial recombination, and annealing at the crystal surface. Temperature fields established during crystal growth are calculated using a global model of heat transfer in the system. Important cases of variable V and pulling halts are considered. Simulations successfully reproduce experimental data such as the shape and position of the interstitial and vacancy regions, including the R-OSF bands. The values of model constants, except for the critical point-defect concentrations, are the same as those obtained for pedestal Si crystals.

Original languageEnglish
Pages (from-to)464-471
Number of pages8
JournalJapanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers
Issue number2 A
Publication statusPublished - 2002 Feb
Externally publishedYes


  • Computer simulation
  • Czochralski silicon
  • Microdefect
  • R-OSF band
  • Self-interstitial
  • Temperature field
  • Transient process
  • Vacancy

ASJC Scopus subject areas

  • General Engineering
  • General Physics and Astronomy


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