TY - GEN
T1 - Contact resistance characteristics of high temperature superconducting bulk- Part IV
AU - Fujita, Hiroyuki
AU - Imaizumi, Takuya
AU - Tomita, Masaru
AU - Sakai, Naomichi
AU - Murakami, Masato
AU - Hirabayashi, Izumi
AU - Sawa, Koichiro
PY - 2005/12/1
Y1 - 2005/12/1
N2 - The authors have measured contact resistances between two bulk YBCO superconductor blocks for the application to a persistent current switch (PCS). In order to reduce a contact resistance, we deposited indium and silver on the sample surfaces. The resistance was reduced by increasing the thickness of the deposited metal layers, but it saturated when the thickness reached a certain level. The saturation thickness was much smaller in indium than silver. Such a difference is understandable by considering the hardness of these two metals. The resistance was also reduced by increasing the mechanical load. Overloading however caused the adhesion of metal layers, resulting in the peeling off of the deposited layers when the switch was opened. Additionally, the contact area of the switch was analyzed with finite element method (FEM). This analysis result may lead to the elucidation of a contact mechanism with the contact surfaces deposited metal.
AB - The authors have measured contact resistances between two bulk YBCO superconductor blocks for the application to a persistent current switch (PCS). In order to reduce a contact resistance, we deposited indium and silver on the sample surfaces. The resistance was reduced by increasing the thickness of the deposited metal layers, but it saturated when the thickness reached a certain level. The saturation thickness was much smaller in indium than silver. Such a difference is understandable by considering the hardness of these two metals. The resistance was also reduced by increasing the mechanical load. Overloading however caused the adhesion of metal layers, resulting in the peeling off of the deposited layers when the switch was opened. Additionally, the contact area of the switch was analyzed with finite element method (FEM). This analysis result may lead to the elucidation of a contact mechanism with the contact surfaces deposited metal.
KW - Contact resistance
KW - Deformation Analysis
KW - Deposition
KW - High-Temperature superconductor
KW - Persistent current switch
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U2 - 10.1109/HOLM.2005.1518256
DO - 10.1109/HOLM.2005.1518256
M3 - Conference contribution
AN - SCOPUS:33747432655
SN - 0780391136
SN - 9780780391130
T3 - Electrical Contacts, Proceedings of the Annual Holm Conference on Electrical Contacts
SP - 272
EP - 276
BT - Electrical Contacts 2005 - Proceedings of the Fifty-First IEEE Holm Conference on Electrical Contacts
T2 - Fifty-First IEEE Holm Conference on Electrical Contacts
Y2 - 26 September 2005 through 28 September 2005
ER -