Contact resistance characteristics of high temperature superconducting bulk- Part IV

Hiroyuki Fujita, Takuya Imaizumi, Masaru Tomita, Naomichi Sakai, Masato Murakami, Izumi Hirabayashi, Koichiro Sawa

Research output: Chapter in Book/Report/Conference proceedingConference contribution

10 Citations (Scopus)


The authors have measured contact resistances between two bulk YBCO superconductor blocks for the application to a persistent current switch (PCS). In order to reduce a contact resistance, we deposited indium and silver on the sample surfaces. The resistance was reduced by increasing the thickness of the deposited metal layers, but it saturated when the thickness reached a certain level. The saturation thickness was much smaller in indium than silver. Such a difference is understandable by considering the hardness of these two metals. The resistance was also reduced by increasing the mechanical load. Overloading however caused the adhesion of metal layers, resulting in the peeling off of the deposited layers when the switch was opened. Additionally, the contact area of the switch was analyzed with finite element method (FEM). This analysis result may lead to the elucidation of a contact mechanism with the contact surfaces deposited metal.

Original languageEnglish
Title of host publicationElectrical Contacts 2005 - Proceedings of the Fifty-First IEEE Holm Conference on Electrical Contacts
Number of pages5
Publication statusPublished - 2005 Dec 1
EventFifty-First IEEE Holm Conference on Electrical Contacts - Chicago, IL, United States
Duration: 2005 Sept 262005 Sept 28

Publication series

NameElectrical Contacts, Proceedings of the Annual Holm Conference on Electrical Contacts
ISSN (Print)0361-4395


ConferenceFifty-First IEEE Holm Conference on Electrical Contacts
Country/TerritoryUnited States
CityChicago, IL


  • Contact resistance
  • Deformation Analysis
  • Deposition
  • High-Temperature superconductor
  • Persistent current switch

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Electrical and Electronic Engineering


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