Original language | English |
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Journal | Default journal |
Publication status | Published - 2012 Dec 1 |
Current developments of scanning confocal electron microscopy in a double aberration-corrected transmission electron microscope
P. Wang, P. Wang;A.I. Kirkl, ;P. D.Nellist;A.J.D’Alfonso;A.J.Morgan;L.J.Allen;A.Has Shimojo
Research output: Contribution to journal › Article › peer-review