Current Developments of Scanning Confocal Electron Microscopy in a Double Aberration-Corrected Transmission Electron Microscope

P. Wang; A. I. Kirkland; P. D. Nellist; A. J. D’alfonso; A. J. Morgan; L. J. Allen; A. Hashimoto; M. Takeguchi; K. Mitsuishi; M. Shimojo

doi:10.1017/S1431927612004515

Current Developments of Scanning Confocal Electron Microscopy in a Double Aberration-Corrected Transmission Electron Microscope

P. Wang, A. I. Kirkland, P. D. Nellist, A. J. D’alfonso, A. J. Morgan, L. J. Allen, A. Hashimoto, M. Takeguchi, K. Mitsuishi, M. Shimojo

Research output: Contribution to journal › Article › peer-review

1 Citation (Scopus)

Original language	English
Pages (from-to)	532-533
Number of pages	2
Journal	Microscopy and Microanalysis
Volume	18
Issue number	S2
DOIs	https://doi.org/10.1017/S1431927612004515
Publication status	Published - 2012 Jul

ASJC Scopus subject areas

Instrumentation

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Wang, P., Kirkland, A. I., Nellist, P. D., D’alfonso, A. J., Morgan, A. J., Allen, L. J., Hashimoto, A., Takeguchi, M., Mitsuishi, K., & Shimojo, M. (2012). Current Developments of Scanning Confocal Electron Microscopy in a Double Aberration-Corrected Transmission Electron Microscope. Microscopy and Microanalysis, 18(S2), 532-533. https://doi.org/10.1017/S1431927612004515

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T1 - Current Developments of Scanning Confocal Electron Microscopy in a Double Aberration-Corrected Transmission Electron Microscope

AU - Wang, P.

AU - Kirkland, A. I.

AU - Nellist, P. D.

AU - D’alfonso, A. J.

AU - Morgan, A. J.

AU - Allen, L. J.

AU - Hashimoto, A.

AU - Takeguchi, M.

AU - Mitsuishi, K.

AU - Shimojo, M.

PY - 2012/7

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JO - Microscopy and Microanalysis

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Current Developments of Scanning Confocal Electron Microscopy in a Double Aberration-Corrected Transmission Electron Microscope

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