Original language | English |
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Journal | Default journal |
Publication status | Published - 2010 Jun 1 |
Development of a double-tilt stage-scanning sample holder for scanning confocal electron microscopy of crystal samples
M. Takeguchi, A. Hashimoto, K. Mitsuishi, X. Zhang, M. Shimojo, T. Ishikawa, S. Deguchi, T. Naruse, Y. Kondo
Research output: Contribution to journal › Article › peer-review