Effects of field plate on buffer-related lag phenomena and current collapse in GaN MESFETs and HEMTs

K. Itagaki, A. Nakajima, K. Horio

Research output: Contribution to journal › Article › peer-review

Original language	English
Pages (from-to)	107-108
Journal	Proceedings of the 32nd Workshop on Compound Semiconductor Devices and Integrated Circuits (WOCSDICE 2008), Leuven, Belgium
Publication status	Published - 2008 May 20

Cite this

@article{5cb13f87b01342bf8b22c58cccb10736,

title = "Effects of field plate on buffer-related lag phenomena and current collapse in GaN MESFETs and HEMTs",

author = "K. Itagaki and A. Nakajima and K. Horio",

year = "2008",

month = may,

day = "20",

language = "English",

pages = "107--108",

journal = "Proceedings of the 32nd Workshop on Compound Semiconductor Devices and Integrated Circuits (WOCSDICE 2008), Leuven, Belgium",

}

TY - JOUR

T1 - Effects of field plate on buffer-related lag phenomena and current collapse in GaN MESFETs and HEMTs

AU - Itagaki, K.

AU - Nakajima, A.

AU - Horio, K.

PY - 2008/5/20

Y1 - 2008/5/20

M3 - Article

SP - 107

EP - 108

JO - Proceedings of the 32nd Workshop on Compound Semiconductor Devices and Integrated Circuits (WOCSDICE 2008), Leuven, Belgium

JF - Proceedings of the 32nd Workshop on Compound Semiconductor Devices and Integrated Circuits (WOCSDICE 2008), Leuven, Belgium

ER -