Abstract
I-V characteristics of GaAs n-i-n structures are calculated by considering impact ionization of carriers. Impact ionization at reverse-biased n-i junction becomes a cause of steep current rise when an acceptor density in the i-layer is high. It is shown that an optimum acceptor density exists to keep a good isolation. Photoconduction transients of GaAs n-i-n structures are also simulated, and are shown to be strongly affected by existence of n-i junctions.
Original language | English |
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Pages (from-to) | 563-572 |
Number of pages | 10 |
Journal | COMPEL - The international journal for computation and mathematics in electrical and electronic engineering |
Volume | 10 |
Issue number | 4 |
DOIs | |
Publication status | Published - 1991 Apr 1 |
ASJC Scopus subject areas
- Computer Science Applications
- Computational Theory and Mathematics
- Electrical and Electronic Engineering
- Applied Mathematics