Effects of source access resistance on gate lag in AlGaN/GaN HEMTs and current slump behavior

K. Horio; A. Nakajima; K. Itagaki

doi:10.1109/DRC.2007.4373653

Effects of source access resistance on gate lag in AlGaN/GaN HEMTs and current slump behavior

K. Horio, A. Nakajima, K. Itagaki

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Original language	English
Title of host publication	65th DRC Device Research Conference
Pages	67-68
Number of pages	2
DOIs	https://doi.org/10.1109/DRC.2007.4373653
Publication status	Published - 2007 Dec 1
Event	65th DRC Device Research Conference - South Bend, India Duration: 2007 Jun 18 → 2007 Jun 20

Publication series

Name	65th DRC Device Research Conference

Conference

Conference	65th DRC Device Research Conference
Country/Territory	India
City	South Bend
Period	07/6/18 → 07/6/20

ASJC Scopus subject areas

Control and Systems Engineering
Electrical and Electronic Engineering

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10.1109/DRC.2007.4373653

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@inproceedings{1bf5bd3fbc96411098e792730cbf5131,

title = "Effects of source access resistance on gate lag in AlGaN/GaN HEMTs and current slump behavior",

author = "K. Horio and A. Nakajima and K. Itagaki",

year = "2007",

month = dec,

day = "1",

doi = "10.1109/DRC.2007.4373653",

language = "English",

isbn = "1424411025",

series = "65th DRC Device Research Conference",

pages = "67--68",

booktitle = "65th DRC Device Research Conference",

note = "65th DRC Device Research Conference ; Conference date: 18-06-2007 Through 20-06-2007",

}

TY - GEN

T1 - Effects of source access resistance on gate lag in AlGaN/GaN HEMTs and current slump behavior

AU - Horio, K.

AU - Nakajima, A.

AU - Itagaki, K.

PY - 2007/12/1

Y1 - 2007/12/1

UR - http://www.scopus.com/inward/record.url?scp=47249159971&partnerID=8YFLogxK

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U2 - 10.1109/DRC.2007.4373653

DO - 10.1109/DRC.2007.4373653

M3 - Conference contribution

AN - SCOPUS:47249159971

SN - 1424411025

SN - 9781424411023

T3 - 65th DRC Device Research Conference

SP - 67

EP - 68

BT - 65th DRC Device Research Conference

T2 - 65th DRC Device Research Conference

Y2 - 18 June 2007 through 20 June 2007

ER -

Effects of source access resistance on gate lag in AlGaN/GaN HEMTs and current slump behavior

Publication series

Conference

ASJC Scopus subject areas

Access to Document

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