Ellipsometric characterization on multi-layered thin film systems during hydrogenation.

D.J. Santjojo, Tatsuhiko Aizawa, Shinji Muraishi

Research output: Contribution to journal › Article › peer-review

Cite this

@article{43b7c462421f4cbcba5933c5c67d538f,

title = "Ellipsometric characterization on multi-layered thin film systems during hydrogenation.",

author = "D.J. Santjojo and Tatsuhiko Aizawa and Shinji Muraishi",

year = "1800",

language = "English",

volume = "48",

pages = "1380--1386",

journal = "Materials Transactions",

issn = "1345-9678",

publisher = "Japan Institute of Metals (JIM)",

}