Far-field diffraction patterns of a dot array with Gaussian random fluctuations

Rajagopalan Uma Maheswari; Toshimitsu Asakura; Nobukatsu Takai

doi:10.1117/12.147823

Far-field diffraction patterns of a dot array with Gaussian random fluctuations

Rajagopalan Uma Maheswari, Toshimitsu Asakura, Nobukatsu Takai

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

1 Citation (Scopus)

Abstract

A theoretical and experimental investigation on the far-field diffraction patterns of a dot array with Gaussian random fluctuations has been done quantitatively by means of a generalized fluctuation parameter. It has been found that the exposure condition strongly influences the nature of the observed photographic pattern and hence the observation of the light-depletion phenomenon first reported by Stark and later, analyzed by Martin and Aime.

Original language	English
Title of host publication	Optical Computing
Editors	Fedor V. Karpushko, George V. Sinitsyn, Sergey P. Apanasevich, Andrey M. Goncharenko
Publisher	SPIE
Pages	151-162
Number of pages	12
ISBN (Electronic)	9780819410061
DOIs	https://doi.org/10.1117/12.147823
Publication status	Published - 1993 Jul 12
Externally published	Yes
Event	Topical Meeting on Optical Computing 1992 - Minsk, Belarus Duration: 1992 Jun 29 → 1992 Jul 1

Publication series

Name	Proceedings of SPIE - The International Society for Optical Engineering
Volume	1806
ISSN (Print)	0277-786X
ISSN (Electronic)	1996-756X

Other

Other	Topical Meeting on Optical Computing 1992
Country/Territory	Belarus
City	Minsk
Period	92/6/29 → 92/7/1

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Condensed Matter Physics
Computer Science Applications
Applied Mathematics
Electrical and Electronic Engineering

Access to Document

10.1117/12.147823

Cite this

Maheswari, R. U., Asakura, T., & Takai, N. (1993). Far-field diffraction patterns of a dot array with Gaussian random fluctuations. In F. V. Karpushko, G. V. Sinitsyn, S. P. Apanasevich, & A. M. Goncharenko (Eds.), Optical Computing (pp. 151-162). (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 1806). SPIE. https://doi.org/10.1117/12.147823

Far-field diffraction patterns of a dot array with Gaussian random fluctuations. / Maheswari, Rajagopalan Uma; Asakura, Toshimitsu; Takai, Nobukatsu.
Optical Computing. ed. / Fedor V. Karpushko; George V. Sinitsyn; Sergey P. Apanasevich; Andrey M. Goncharenko. SPIE, 1993. p. 151-162 (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 1806).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Maheswari, RU, Asakura, T & Takai, N 1993, Far-field diffraction patterns of a dot array with Gaussian random fluctuations. in FV Karpushko, GV Sinitsyn, SP Apanasevich & AM Goncharenko (eds), Optical Computing. Proceedings of SPIE - The International Society for Optical Engineering, vol. 1806, SPIE, pp. 151-162, Topical Meeting on Optical Computing 1992, Minsk, Belarus, 92/6/29. https://doi.org/10.1117/12.147823

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AB - A theoretical and experimental investigation on the far-field diffraction patterns of a dot array with Gaussian random fluctuations has been done quantitatively by means of a generalized fluctuation parameter. It has been found that the exposure condition strongly influences the nature of the observed photographic pattern and hence the observation of the light-depletion phenomenon first reported by Stark and later, analyzed by Martin and Aime.

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PB - SPIE

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ER -

Far-field diffraction patterns of a dot array with Gaussian random fluctuations

Abstract

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ASJC Scopus subject areas

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