Abstract
Power semiconductor devices for electric power conversion must be highly efficient, compact, and with large capacity. Therefore, highly thermo stability and long fatigue lifetime are necessary for the joint materials of these devices. In this paper, we discuss the joint reliability obtained by applying the supersaturated Sn-13wt. % Sb binary alloy. Through this process, the joint materials achieve a thermo stable up to 175 °C or more. Thus, they can be used in wide-bandgap semiconductors to join the ceramic substrate with the heat sink. Finally, we examine the new material properties (tensile and low cycling fatigue). The thermal cycling lifetime of supersaturated Sn-Sb joints is significantly affected by the material's microstructure; when its crystal grains are large, the material has a longer lifetime. Consequently, in SbSn compounds, which crystallize in the β-Sn matrix, solder crack propagation can be prevented when the compound is large enough; there is a mechanism that suppresses the propagation speed of the crack. In addition, the supersaturated Sn-13wt. %Sb binary alloy is also resistant up to 150 °C, above the higher temperature at which the joints are exposed to. Therefore, this application can ensure high reliability for the high temperature operating devices, which operate at 175 °C temperature or higher.
Original language | English |
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Title of host publication | 2016 International Conference on Electronics Packaging, ICEP 2016 |
Publisher | Institute of Electrical and Electronics Engineers Inc. |
Pages | 405-410 |
Number of pages | 6 |
ISBN (Electronic) | 9784904090176 |
DOIs | |
Publication status | Published - 2016 Jun 7 |
Event | 2016 International Conference on Electronics Packaging, ICEP 2016 - Hokkaido, Japan Duration: 2016 Apr 20 → 2016 Apr 22 |
Other
Other | 2016 International Conference on Electronics Packaging, ICEP 2016 |
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Country/Territory | Japan |
City | Hokkaido |
Period | 16/4/20 → 16/4/22 |
Keywords
- Crack propagation
- Sn-Sb binary alloy
- Solidification rate
- Strengthening mechanism
- Thermal cycling test
- Thermal stress
- Wide-bandgap semiconductor
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Electrical and Electronic Engineering
- Mechanics of Materials