Impact of fault resistance on impedance relay: Adaptive Mho directional type scheme development using LabVIEW

David Majambere, Goro Fujita

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)


Normally, fault resistances come out with errors in the fault calculation algorithm on conventional Mho distance protection scheme which might force the relay to under-reach/over-reach based on the network conditions. With a constrained shape, Mho Directional distance elements can provide more resistive coverage while discriminating between forward and reverse faults. In this work, the recurring effect a fault resistance can have on a Mho Distance protection scheme relay is assessed and analyzed for single line-to-ground(SLG) faults for both protective schemes. Finally, an adaptive correction algorithm is applied to compensate errors introduced in the fault calculation unit using local end data. The design and simulation are performed using LabVIEW and MATLAB/SIMULINK. Magnitudes and angles of three voltages and currents are obtained through Discrete Fourier Transform(DFT). Different scenarios are carried out and validate the effectiveness of the scheme. Moreover, an improved Graphical User Interface(GUI) is developed for easy and convenient interaction between users and the relay model.

Original languageEnglish
Title of host publicationTENCON 2017 - 2017 IEEE Region 10 Conference
PublisherInstitute of Electrical and Electronics Engineers Inc.
Number of pages6
ISBN (Electronic)9781509011339
Publication statusPublished - 2017 Dec 19
Event2017 IEEE Region 10 Conference, TENCON 2017 - Penang, Malaysia
Duration: 2017 Nov 52017 Nov 8

Publication series

NameIEEE Region 10 Annual International Conference, Proceedings/TENCON
ISSN (Print)2159-3442
ISSN (Electronic)2159-3450


Other2017 IEEE Region 10 Conference, TENCON 2017


  • Conventional Mho
  • Directional Mho
  • Distance relay
  • Fault location
  • Fault resistance
  • Graphical User Interface
  • LabVIEW

ASJC Scopus subject areas

  • Computer Science Applications
  • Electrical and Electronic Engineering


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