TY - GEN
T1 - Influence of anti-resonance peak in power supply network on power and signal integrity
AU - Yamaguchi, Toma
AU - Hatogai, Yusuke
AU - Sudo, Toshio
PY - 2013/12/24
Y1 - 2013/12/24
N2 - Reduction of PDN impedance is necessary to prevent false logic operation of the CMOS LSIs. Constant target impedance with frequency is used as a simple method to define PDN impedance of the system. However, this conventional target impedance did not change with frequency, and was not applied to the high frequency range where PDN impedance exceeds the constant value of target impedance. Therefore, newly frequency dependent target impedance has been derived and applied to the DDR3 memory system. Co-simulation model has been established to estimate power Integrity (PI) and signal Integrity (SI) at the same time. The switching current flowing from the chip was connected to the whole PDN model, and power supply noise and eyes diagram were simulated. The new target impedance has been proved to be reasonable for maintaining the power supply noise and the eye diagrams.
AB - Reduction of PDN impedance is necessary to prevent false logic operation of the CMOS LSIs. Constant target impedance with frequency is used as a simple method to define PDN impedance of the system. However, this conventional target impedance did not change with frequency, and was not applied to the high frequency range where PDN impedance exceeds the constant value of target impedance. Therefore, newly frequency dependent target impedance has been derived and applied to the DDR3 memory system. Co-simulation model has been established to estimate power Integrity (PI) and signal Integrity (SI) at the same time. The switching current flowing from the chip was connected to the whole PDN model, and power supply noise and eyes diagram were simulated. The new target impedance has been proved to be reasonable for maintaining the power supply noise and the eye diagrams.
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M3 - Conference contribution
AN - SCOPUS:84890657479
SN - 9781467349796
T3 - IEEE International Symposium on Electromagnetic Compatibility
SP - 224
EP - 228
BT - Proceedings of the 2013 International Symposium on Electromagnetic Compatibility, EMC Europe 2013
T2 - 2013 International Symposium on Electromagnetic Compatibility, EMC Europe 2013
Y2 - 2 September 2013 through 6 September 2013
ER -