Abstract
Tin sulfide (SnS) films were prepared by RF sputtering method. The component, crystal structure, optical properties and electrical properties of SnS films were measured. The relationship between the SnS films properties and the sputtering condition was discussed. Using Sb as a dopant and combining thermal annealing at elevated temperatures (about 400°C), the n-type SnS films were obtained.
Original language | English |
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Pages (from-to) | 365-368 |
Number of pages | 4 |
Journal | Conference Record of the IEEE Photovoltaic Specialists Conference |
Volume | 1 |
Publication status | Published - 1994 Dec 1 |
Externally published | Yes |
Event | Proceedings of the 24th IEEE Photovoltaic Specialists Conference. Part 2 (of 2) - Waikoloa, HI, USA Duration: 1994 Dec 5 → 1994 Dec 9 |
ASJC Scopus subject areas
- Control and Systems Engineering
- Industrial and Manufacturing Engineering
- Electrical and Electronic Engineering