Label-free measurement of cell-electrode cleft gap distance with a high spatial resolution surface plasmon microscopy

Koji Toma; Hiroshi Kano; Andreas Offenhäusser

doi:10.1364/jsap.2014.18a_c4_4

Label-free measurement of cell-electrode cleft gap distance with a high spatial resolution surface plasmon microscopy

Koji Toma, Hiroshi Kano, Andreas Offenhäusser

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Original language	English
Title of host publication	JSAP-OSA Joint Symposia, JSAP 2014
Publisher	Optical Society of America (OSA)
ISBN (Electronic)	9784863484436
DOIs	https://doi.org/10.1364/jsap.2014.18a_c4_4
Publication status	Published - 2014 Sept 1
Externally published	Yes
Event	JSAP-OSA Joint Symposia, JSAP 2014 - Sapporo, Hokkaido, Japan Duration: 2014 Sept 17 → 2014 Sept 20

Publication series

Name	JSAP-OSA Joint Symposia, JSAP 2014

Conference

Conference	JSAP-OSA Joint Symposia, JSAP 2014
Country/Territory	Japan
City	Sapporo, Hokkaido
Period	14/9/17 → 14/9/20

ASJC Scopus subject areas

Electrical and Electronic Engineering
Electronic, Optical and Magnetic Materials
Atomic and Molecular Physics, and Optics

Access to Document

10.1364/jsap.2014.18a_c4_4

Cite this

Label-free measurement of cell-electrode cleft gap distance with a high spatial resolution surface plasmon microscopy. / Toma, Koji; Kano, Hiroshi; Offenhäusser, Andreas.
JSAP-OSA Joint Symposia, JSAP 2014. Optical Society of America (OSA), 2014. (JSAP-OSA Joint Symposia, JSAP 2014).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Toma, K, Kano, H & Offenhäusser, A 2014, Label-free measurement of cell-electrode cleft gap distance with a high spatial resolution surface plasmon microscopy. in JSAP-OSA Joint Symposia, JSAP 2014. JSAP-OSA Joint Symposia, JSAP 2014, Optical Society of America (OSA), JSAP-OSA Joint Symposia, JSAP 2014, Sapporo, Hokkaido, Japan, 14/9/17. https://doi.org/10.1364/jsap.2014.18a_c4_4

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T3 - JSAP-OSA Joint Symposia, JSAP 2014

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Label-free measurement of cell-electrode cleft gap distance with a high spatial resolution surface plasmon microscopy

Publication series

Conference

ASJC Scopus subject areas

Access to Document

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Cite this