| Original language | English |
|---|---|
| Pages (from-to) | 77-104 |
| Journal | Default journal |
| Publication status | Published - 2006 Oct 1 |
Leakage in Nanometer CMOS Technologies -Methodologies for Power Gating
Kimiyoshi Usami, Takayasu Sakurai, 16 more authors.
Research output: Contribution to journal › Article › peer-review