Abstract
N-doped and In-N-codoped ZnO films were fabricated on quartz glass substrate by sol-gel spin coating. Their p-type conductivities were characterized by the Hall measurements, revealing low resistivities of the order of 10-1 Ω cm. Thin-film junctions comprising an undoped ZnO layer and a N-doped ZnO layer displayed the typical rectifying characteristics, suggesting formation of p-n homojunctions at the interfaces.
Original language | English |
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Article number | 251116 |
Journal | Applied Physics Letters |
Volume | 88 |
Issue number | 25 |
DOIs | |
Publication status | Published - 2006 Jun 19 |
Externally published | Yes |
ASJC Scopus subject areas
- Physics and Astronomy (miscellaneous)