TY - GEN
T1 - Microfabricated electrostatic planar lens array and extractors for multi-focused ion beam system using ionic liquid ion source emitter array
AU - Yoshida, Ryo
AU - Hara, Motoaki
AU - Oguchi, Hiroyuki
AU - Kuwano, Hiroki
N1 - Publisher Copyright:
© 2015 IEEE.
PY - 2015/2/26
Y1 - 2015/2/26
N2 - This paper describes development of the electrostatic planar extractors and lenses integrated with the ionic liquid ion source (ILIS) array to realize multi focused ion beam system. The extractors and the lenses reduced ion beam divergence angle from 11° to 7.9°. Also, switching control of ion beam was demonstrated by operating separated extractors. Finally we performed Si substrate etching using various kinds of ionic liquid. As a result, 3.3 times larger sputtering yield of 7.3 atom/ion at 83% lower acceleration voltage than those of conventional Ga+ focused ion beam (FIB) was achieved.
AB - This paper describes development of the electrostatic planar extractors and lenses integrated with the ionic liquid ion source (ILIS) array to realize multi focused ion beam system. The extractors and the lenses reduced ion beam divergence angle from 11° to 7.9°. Also, switching control of ion beam was demonstrated by operating separated extractors. Finally we performed Si substrate etching using various kinds of ionic liquid. As a result, 3.3 times larger sputtering yield of 7.3 atom/ion at 83% lower acceleration voltage than those of conventional Ga+ focused ion beam (FIB) was achieved.
UR - http://www.scopus.com/inward/record.url?scp=84931089460&partnerID=8YFLogxK
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U2 - 10.1109/MEMSYS.2015.7050894
DO - 10.1109/MEMSYS.2015.7050894
M3 - Conference contribution
AN - SCOPUS:84931089460
T3 - Proceedings of the IEEE International Conference on Micro Electro Mechanical Systems (MEMS)
SP - 93
EP - 96
BT - 2015 28th IEEE International Conference on Micro Electro Mechanical Systems, MEMS 2015
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 2015 28th IEEE International Conference on Micro Electro Mechanical Systems, MEMS 2015
Y2 - 18 January 2015 through 22 January 2015
ER -