Microtexture of magnetite thin films of (001) and (111) orientations on MgO substrates studied by electron-backscatter diffraction

A. Koblischka-Veneva; M. R. Koblischka; S. Murphy; S. K. Arora; F. Mücklich; U. Hartmann; I. V. Shvets

doi:10.1063/1.2837283

Microtexture of magnetite thin films of (001) and (111) orientations on MgO substrates studied by electron-backscatter diffraction

A. Koblischka-Veneva, M. R. Koblischka, S. Murphy, S. K. Arora, F. Mücklich, U. Hartmann, I. V. Shvets

Research output: Contribution to journal › Article › peer-review

3 Citations (Scopus)

Abstract

The grain orientation of (001)- and (111)-oriented magnetite thin films grown on MgO substrates (film thickness of 100-400 nm) is analyzed by means of the electron-backscatter diffraction (EBSD) technique. The (001) surface after a short annealing in air (1 min, 250 °C) is characterized by the presence of tiny (diameter of 100-200 nm) misoriented islands, which have an influence on the antiferromagnetic coupling within the film. In the (111)-oriented films, such defects are found to be absent, and the films show a very homogeneous surface. The achieved spatial resolution enables further a cross-section analysis of a 400-nm -thick film with (001) orientation, even close to the interface MgO-magnetite.

Original language	English
Article number	07E505
Journal	Journal of Applied Physics
Volume	103
Issue number	7
DOIs	https://doi.org/10.1063/1.2837283
Publication status	Published - 2008
Externally published	Yes

ASJC Scopus subject areas

Physics and Astronomy(all)

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10.1063/1.2837283

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@article{b68c1954beed416aa223796906b9bea3,

title = "Microtexture of magnetite thin films of (001) and (111) orientations on MgO substrates studied by electron-backscatter diffraction",

abstract = "The grain orientation of (001)- and (111)-oriented magnetite thin films grown on MgO substrates (film thickness of 100-400 nm) is analyzed by means of the electron-backscatter diffraction (EBSD) technique. The (001) surface after a short annealing in air (1 min, 250 °C) is characterized by the presence of tiny (diameter of 100-200 nm) misoriented islands, which have an influence on the antiferromagnetic coupling within the film. In the (111)-oriented films, such defects are found to be absent, and the films show a very homogeneous surface. The achieved spatial resolution enables further a cross-section analysis of a 400-nm -thick film with (001) orientation, even close to the interface MgO-magnetite.",

author = "A. Koblischka-Veneva and Koblischka, {M. R.} and S. Murphy and Arora, {S. K.} and F. M{\"u}cklich and U. Hartmann and Shvets, {I. V.}",

note = "Funding Information: This work is supported by DFG Project No. MU959/19 and the EU-funded project “ASPRINT” (Contract No. NMP4-CT-2003-1601), which is gratefully acknowledged. ",

year = "2008",

doi = "10.1063/1.2837283",

language = "English",

volume = "103",

journal = "Journal of Applied Physics",

issn = "0021-8979",

publisher = "American Institute of Physics Publising LLC",

number = "7",

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TY - JOUR

T1 - Microtexture of magnetite thin films of (001) and (111) orientations on MgO substrates studied by electron-backscatter diffraction

AU - Koblischka-Veneva, A.

AU - Koblischka, M. R.

AU - Murphy, S.

AU - Arora, S. K.

AU - Mücklich, F.

AU - Hartmann, U.

AU - Shvets, I. V.

N1 - Funding Information: This work is supported by DFG Project No. MU959/19 and the EU-funded project “ASPRINT” (Contract No. NMP4-CT-2003-1601), which is gratefully acknowledged.

PY - 2008

Y1 - 2008

N2 - The grain orientation of (001)- and (111)-oriented magnetite thin films grown on MgO substrates (film thickness of 100-400 nm) is analyzed by means of the electron-backscatter diffraction (EBSD) technique. The (001) surface after a short annealing in air (1 min, 250 °C) is characterized by the presence of tiny (diameter of 100-200 nm) misoriented islands, which have an influence on the antiferromagnetic coupling within the film. In the (111)-oriented films, such defects are found to be absent, and the films show a very homogeneous surface. The achieved spatial resolution enables further a cross-section analysis of a 400-nm -thick film with (001) orientation, even close to the interface MgO-magnetite.

AB - The grain orientation of (001)- and (111)-oriented magnetite thin films grown on MgO substrates (film thickness of 100-400 nm) is analyzed by means of the electron-backscatter diffraction (EBSD) technique. The (001) surface after a short annealing in air (1 min, 250 °C) is characterized by the presence of tiny (diameter of 100-200 nm) misoriented islands, which have an influence on the antiferromagnetic coupling within the film. In the (111)-oriented films, such defects are found to be absent, and the films show a very homogeneous surface. The achieved spatial resolution enables further a cross-section analysis of a 400-nm -thick film with (001) orientation, even close to the interface MgO-magnetite.

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U2 - 10.1063/1.2837283

DO - 10.1063/1.2837283

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AN - SCOPUS:42349098991

SN - 0021-8979

VL - 103

JO - Journal of Applied Physics

JF - Journal of Applied Physics

IS - 7

M1 - 07E505

ER -

Microtexture of magnetite thin films of (001) and (111) orientations on MgO substrates studied by electron-backscatter diffraction

Abstract

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