TY - GEN
T1 - Novel in-situ passivation of MoCl5 doped multilayer graphene with MoOx for low-resistance interconnects
AU - Kawamoto, K.
AU - Saito, Y.
AU - Kenmoku, M.
AU - Ueno, K.
N1 - Funding Information:
This work was partially supported by "Ultra-Low Voltage Device Project" funded and supported by METI and NEDO. This presentation is supported by the Research Center for Green Innovation of SIT.
Publisher Copyright:
© 2017 IEEE.
Copyright:
Copyright 2017 Elsevier B.V., All rights reserved.
PY - 2017/6/13
Y1 - 2017/6/13
N2 - To improve the stability of multilayer graphene (MLG) doped with molybdenum pentachloride (MoCl5) for low-resistance interconnects, we have newly developed an in-situ passivation process with molybdenum oxides. The improved air stability of dopants was confirmed with Raman spectroscopy by the direct MoOx passivation at room temperature.
AB - To improve the stability of multilayer graphene (MLG) doped with molybdenum pentachloride (MoCl5) for low-resistance interconnects, we have newly developed an in-situ passivation process with molybdenum oxides. The improved air stability of dopants was confirmed with Raman spectroscopy by the direct MoOx passivation at room temperature.
KW - doping
KW - graphene
KW - interconnect
UR - http://www.scopus.com/inward/record.url?scp=85021962090&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=85021962090&partnerID=8YFLogxK
U2 - 10.1109/EDTM.2017.7947586
DO - 10.1109/EDTM.2017.7947586
M3 - Conference contribution
AN - SCOPUS:85021962090
T3 - 2017 IEEE Electron Devices Technology and Manufacturing Conference, EDTM 2017 - Proceedings
SP - 252
EP - 254
BT - 2017 IEEE Electron Devices Technology and Manufacturing Conference, EDTM 2017 - Proceedings
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 2017 IEEE Electron Devices Technology and Manufacturing Conference, EDTM 2017
Y2 - 28 February 2017 through 2 March 2017
ER -