Abstract
This paper reports a novel structure of a plastic package without a die-pad, whereby adhesion strength is improved and thermal stress reduced. The non-die-pad structure has been realized by the chip side support method. Further, the derivation of an equation that can be used as a criterion for judging package cracking or delamination is described by comparing the shear strength with the shear stress. The equation for shear stress can be estimated by the finite element method.
Original language | English |
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Pages | 310-317 |
Number of pages | 8 |
Publication status | Published - 1995 Dec 1 |
Event | Proceedings of the 17th IEEE/CPMT International Electronics Manufacturing Technology Symposium - Austin, TX, USA Duration: 1995 Oct 2 → 1995 Oct 4 |
Other
Other | Proceedings of the 17th IEEE/CPMT International Electronics Manufacturing Technology Symposium |
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City | Austin, TX, USA |
Period | 95/10/2 → 95/10/4 |
ASJC Scopus subject areas
- Industrial and Manufacturing Engineering
- Electrical and Electronic Engineering