Fingerprint
Dive into the research topics of 'Numerical analysis of pulsed I-V curves and current collapse in GaN FETs as affected by buffer trapping'. Together they form a unique fingerprint.- Sort by
- Weight
- Alphabetically
Numerical analysis of pulsed I-V curves and current collapse in GaN FETs as affected by buffer trapping
H. Nakano, H. Takayanagi, K. Yonemoto, K. Horio
Research output: Contribution to journal › Conference article › peer-review