Observation of record flux pinning in melt-textured NEG-123 superconductor doped by Nb, Mo, and Ti nanoparticles

M. Muralidhar, M. Tomita, M. Jirsa, N. Sakai, M. Murakami, I. Hirabayashi

Research output: Contribution to journalArticlepeer-review

7 Citations (Scopus)

Abstract

Flux pinning in melt-processed (Nd0.33Eu0.33Gd0.33)Ba2Cu3Oy "NEG-123" + 35 mol% Gd2BaCuO5 "NEG-211" (70 nm in size) composite doped by TiO3, MoO3 and Nb2O5 achieved record values. The optimum values of all three dopands were found to be around 0.1 mol%. Transmission electron microscope (TEM) analysis found clouds of <10 nm sized particles in the NEG-123 matrix, shifting the pinning particle size distribution to significantly lower values. TEM by energy dispersive X-ray spectroscopy (EDX) analysis clarified that these nanoparticles contained a significant amount of Nb, Mo, and Ti. Appearance of nanometer-sized defects correlated with a significantly improved flux pining at low and medium magnetic fields, which was particularly significant at high temperatures. In the Nb-doped sample, a record Jc value of 925 kA/cm2 at the secondary peak field (4.5 T) was achieved at 65 K, 640 kA/cm2 at zero field at 77 K, and 100 kA/cm2 at 90.2 K, the last value having been up to now considered as a good standard for REBa2Cu3Oy "RE-123" materials at 77 K. The greatly improved Jc-B performance in Nb/Mo/Ti doped samples can be easily translated to large-scale LRE-123 (LRE = light rare earths, Nd, Eu, Gd, Sm) blocks intended for real superconducting super-magnets applications.

Original languageEnglish
Pages (from-to)1196-1199
Number of pages4
JournalPhysica C: Superconductivity and its applications
Volume469
Issue number15-20
DOIs
Publication statusPublished - 2009 Oct 15

Keywords

  • Flux pinning
  • High J
  • LRE-BaCuO
  • NEG superconductor
  • Nanoparticles
  • TEM

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Energy Engineering and Power Technology
  • Electrical and Electronic Engineering

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