Open/Short Testing of Thin Film Multilayer Substrates,

Y.Iseki Y.Iseki, S.kimijima S.kimijima, T.Sudo T.Sudo, Toshio Sudo

Research output: Contribution to journalArticlepeer-review

Original languageEnglish
Pages (from-to)265-267
JournalJapan IEMT
Publication statusPublished - 1992 Oct 1

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