Original language | English |
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Pages (from-to) | 28p-D-1 |
Journal | Default journal |
Publication status | Published - 1997 Mar 1 |
Optical characterization of GaN/sapphire films by spectroscopic ellipsometery and the optical transmission method
G. Wang, G. Yu, H. Ishikawa, T. Egawa, J. Watanabe, T. Jimbo, M. Umeno
Research output: Contribution to journal › Article › peer-review