Optical sectioning and confocal microscopy in an aberration-corrected transmission electron microscope for three-dimensional imaging and analysis of materials

P. D. Nellist; P. D.Nellist;P.Wang;A.I. Kirkl; ;A. J.DAlfonso;A.J.Morgan;L.J.Allen;A.Hashimoto;M.Take Shimojo

Optical sectioning and confocal microscopy in an aberration-corrected transmission electron microscope for three-dimensional imaging and analysis of materials

P. D. Nellist, P. D.Nellist;P.Wang;A.I. Kirkl, ;A. J.DAlfonso;A.J.Morgan;L.J.Allen;A.Hashimoto;M.Take Shimojo

Functional Control Systems

Research output: Contribution to journal › Article › peer-review

Original language	English
Journal	Default journal
Publication status	Published - 2012 Dec 1

Cite this

Optical sectioning and confocal microscopy in an aberration-corrected transmission electron microscope for three-dimensional imaging and analysis of materials. / Nellist, P. D.; Kirkl, P. D.Nellist;P.Wang;A.I.; Shimojo, ;A. J.DAlfonso;A.J.Morgan;L.J.Allen;A.Hashimoto;M.Take.
In: Default journal, 01.12.2012.

Research output: Contribution to journal › Article › peer-review

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