Partial-Discharge Phenomenology in Compressed SF6 under Stochastic Conditions

M.F. Frechette, C.Hudon C.Hudon, M. Germain, R.Y.Larocque R.Y.Larocque, Satoshi Matsumoto, Tokihiro Umemura

Research output: Contribution to journal › Article › peer-review

Original language	English
Pages (from-to)	639-644
Journal	IEEE Conf. on Electr. Insul. and Diel. Phen.
Publication status	Published - 2000 Oct 15

Cite this

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title = "Partial-Discharge Phenomenology in Compressed SF6 under Stochastic Conditions",

author = "M.F. Frechette and C.Hudon C.Hudon and M. Germain and R.Y.Larocque R.Y.Larocque and Satoshi Matsumoto and Tokihiro Umemura",

year = "2000",

month = oct,

day = "15",

language = "English",

pages = "639--644",

journal = "IEEE Conf. on Electr. Insul. and Diel. Phen.",

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TY - JOUR

T1 - Partial-Discharge Phenomenology in Compressed SF6 under Stochastic Conditions

AU - Frechette, M.F.

AU - C.Hudon, C.Hudon

AU - Germain, M.

AU - R.Y.Larocque, R.Y.Larocque

AU - Matsumoto, Satoshi

AU - Umemura, Tokihiro

PY - 2000/10/15

Y1 - 2000/10/15

M3 - Article

SP - 639

EP - 644

JO - IEEE Conf. on Electr. Insul. and Diel. Phen.

JF - IEEE Conf. on Electr. Insul. and Diel. Phen.

ER -