The nanometer-scale pinning defects observed in melt-processed (Nd0.33Eu0.38Gd0.28)Ba2Cu3 Oy (NEG-123) materials were discussed. The analysis with scanning tunneling microscope (STM) and dynamic force microscope (DFM) revealed a nanoscale laminar structure with a period comparable to the coherence length that is most probably responsible for the pinning enhancement. The observations demonstrated a secondary peak as high as 70 kA/cm2 at 4.5 T and decreased to 49 and 22 kA/cm2 at 7 and 10 T respectively.
|Number of pages||3|
|Journal||Applied Physics Letters|
|Publication status||Published - 2003 Feb 10|
ASJC Scopus subject areas
- Physics and Astronomy (miscellaneous)