Pinning characteristics in chemically modified (Nd, Eu, Gd)-Ba-Cu-O superconductors

M. Muralidhar; N. Sakai; M. Nishiyama; M. Jirsa; T. Machi; M. Murakami

doi:10.1063/1.1542927

Pinning characteristics in chemically modified (Nd, Eu, Gd)-Ba-Cu-O superconductors

M. Muralidhar, N. Sakai, M. Nishiyama, M. Jirsa, T. Machi, M. Murakami

Research output: Contribution to journal › Article › peer-review

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Abstract

The nanometer-scale pinning defects observed in melt-processed (Nd_0.33Eu_0.38Gd_0.28)Ba₂Cu₃O_y (NEG-123) materials were discussed. The analysis with scanning tunneling microscope (STM) and dynamic force microscope (DFM) revealed a nanoscale laminar structure with a period comparable to the coherence length that is most probably responsible for the pinning enhancement. The observations demonstrated a secondary peak as high as 70 kA/cm² at 4.5 T and decreased to 49 and 22 kA/cm² at 7 and 10 T respectively.

Original language	English
Pages (from-to)	943-945
Number of pages	3
Journal	Applied Physics Letters
Volume	82
Issue number	6
DOIs	https://doi.org/10.1063/1.1542927
Publication status	Published - 2003 Feb 10
Externally published	Yes

ASJC Scopus subject areas

Physics and Astronomy (miscellaneous)

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abstract = "The nanometer-scale pinning defects observed in melt-processed (Nd0.33Eu0.38Gd0.28)Ba2Cu3 Oy (NEG-123) materials were discussed. The analysis with scanning tunneling microscope (STM) and dynamic force microscope (DFM) revealed a nanoscale laminar structure with a period comparable to the coherence length that is most probably responsible for the pinning enhancement. The observations demonstrated a secondary peak as high as 70 kA/cm2 at 4.5 T and decreased to 49 and 22 kA/cm2 at 7 and 10 T respectively.",

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AU - Muralidhar, M.

AU - Sakai, N.

AU - Nishiyama, M.

AU - Jirsa, M.

AU - Machi, T.

AU - Murakami, M.

PY - 2003/2/10

Y1 - 2003/2/10

N2 - The nanometer-scale pinning defects observed in melt-processed (Nd0.33Eu0.38Gd0.28)Ba2Cu3 Oy (NEG-123) materials were discussed. The analysis with scanning tunneling microscope (STM) and dynamic force microscope (DFM) revealed a nanoscale laminar structure with a period comparable to the coherence length that is most probably responsible for the pinning enhancement. The observations demonstrated a secondary peak as high as 70 kA/cm2 at 4.5 T and decreased to 49 and 22 kA/cm2 at 7 and 10 T respectively.

AB - The nanometer-scale pinning defects observed in melt-processed (Nd0.33Eu0.38Gd0.28)Ba2Cu3 Oy (NEG-123) materials were discussed. The analysis with scanning tunneling microscope (STM) and dynamic force microscope (DFM) revealed a nanoscale laminar structure with a period comparable to the coherence length that is most probably responsible for the pinning enhancement. The observations demonstrated a secondary peak as high as 70 kA/cm2 at 4.5 T and decreased to 49 and 22 kA/cm2 at 7 and 10 T respectively.

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Pinning characteristics in chemically modified (Nd, Eu, Gd)-Ba-Cu-O superconductors

Abstract

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