Reversible creation and annihilation of a local leakage path in HfO2/GeOx stacked gate dielectrics: A direct observation by ultrahigh vacuum conducting atomic force microscopy

K.Yamamura K.Yamamura, K.Kita K.Kita, A.Toriumi A.Toriumi, K.Kyuno K.Kyuno, Kentaro Kyuno

Research output: Contribution to journalArticlepeer-review

Original languageEnglish
JournalApplied Physics Letters 89
Publication statusPublished - 2006 Nov 1

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