| Original language | English |
|---|---|
| Journal | Default journal |
| Publication status | Published - 2012 Dec 1 |
Scanning confocal electron microscopy (SCEM) combined with deconvolution technique
M. Takeguchi, M. Takeguchi;X.Zhang;A.Hashimoto;K.Mitsuishi;M.Shimoj Kirkl, Masayuki Shimojo
Research output: Contribution to journal › Article › peer-review