Scanning Confocal Electron Microscopy (SCEM) Combined with Deconvolution Technique

M. Takeguchi, X. Zhang, A. Hashimoto, K. Mitsuishi, M. Shimojo, P. Wang, N. D. Peter, A. I. Kirkland

Research output: Contribution to journalArticlepeer-review

1 Citation (Scopus)
Original languageEnglish
Pages (from-to)332-333
Number of pages2
JournalMicroscopy and Microanalysis
Publication statusPublished - 2012 Jul

ASJC Scopus subject areas

  • Instrumentation

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