Original language | English |
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Pages (from-to) | 4930-4935 |
Journal | Journal of Applied Physics |
Volume | 86 |
Publication status | Published - 1999 Nov 1 |
Seed layer dependence of room-temperature recrystallization elecroplated copper films
K.Ueno K.Ueno, T.Ritzdorf T.Ritzdorf, S.Grace S.Grace, Kazuyoshi Ueno
Research output: Contribution to journal › Article › peer-review
65
Citations
(Scopus)