Simulation of lag phenomena and pulsed I-V curves of compound semiconductor FETs as affected by impact ionization

Y. Kazami, D. Kasai, Y. Mitani, K. Horio

Research output: Contribution to journal › Article › peer-review

Original language	English
Pages (from-to)	203-206
Journal	Journal of Computational Electronics
Volume	Vol.2
Publication status	Published - 2003 Dec 1

Cite this

@article{833b50a0332742eba516db9cd52812c3,

title = "Simulation of lag phenomena and pulsed I-V curves of compound semiconductor FETs as affected by impact ionization",

author = "Y. Kazami and D. Kasai and Y. Mitani and K. Horio",

year = "2003",

month = dec,

day = "1",

language = "English",

volume = "Vol.2",

pages = "203--206",

journal = "Journal of Computational Electronics",

issn = "1569-8025",

publisher = "Springer Netherlands",

}