Simulation of reduction properties of radiated emission by on-chip decoupling capacitor

Toshio Sudo; Manabu Bonkohara

doi:10.1109/SPI.2002.258278

Simulation of reduction properties of radiated emission by on-chip decoupling capacitor

Toshio Sudo, Manabu Bonkohara

Electrical Engineering and Computer Science

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

2 Citations (Scopus)

Abstract

This paper reports simulation results on simultaneous switching noise and radiated emission due to the existence of on-chip decoupling capacitor. Signal overshoots/undershoots was observed for the case of on-chip decoupling capacitor, while signal degradation was observed for the case of without on-chip decoupling capacitor. The behavior of ground bounce for the case of on-chip capacitor was different from the case of without on-chip capacitor. The current flow at the power and ground terminals was used as excitation source of FDTD model with the power/ ground plane. The simulation results were compared with the measurement data.

Original language	English
Title of host publication	Proceedings - 6th IEEE Workshop on Signal Propagation on Interconnects, SPI
Pages	15-18
Number of pages	4
DOIs	https://doi.org/10.1109/SPI.2002.258278
Publication status	Published - 2002 Dec 1
Event	6th IEEE Workshop on Signal Propagation on Interconnects, SPI - Pisa, Italy Duration: 2002 May 12 → 2002 May 15

Publication series

Name	Proceedings - 6th IEEE Workshop on Signal Propagation on Interconnects, SPI

Conference

Conference	6th IEEE Workshop on Signal Propagation on Interconnects, SPI
Country/Territory	Italy
City	Pisa
Period	02/5/12 → 02/5/15

ASJC Scopus subject areas

Signal Processing
Computer Networks and Communications

Access to Document

10.1109/SPI.2002.258278

Cite this

Simulation of reduction properties of radiated emission by on-chip decoupling capacitor. / Sudo, Toshio; Bonkohara, Manabu.

Proceedings - 6th IEEE Workshop on Signal Propagation on Interconnects, SPI. 2002. p. 15-18 4027643 (Proceedings - 6th IEEE Workshop on Signal Propagation on Interconnects, SPI).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Sudo, T & Bonkohara, M 2002, Simulation of reduction properties of radiated emission by on-chip decoupling capacitor. in Proceedings - 6th IEEE Workshop on Signal Propagation on Interconnects, SPI., 4027643, Proceedings - 6th IEEE Workshop on Signal Propagation on Interconnects, SPI, pp. 15-18, 6th IEEE Workshop on Signal Propagation on Interconnects, SPI, Pisa, Italy, 02/5/12. https://doi.org/10.1109/SPI.2002.258278

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abstract = "This paper reports simulation results on simultaneous switching noise and radiated emission due to the existence of on-chip decoupling capacitor. Signal overshoots/undershoots was observed for the case of on-chip decoupling capacitor, while signal degradation was observed for the case of without on-chip decoupling capacitor. The behavior of ground bounce for the case of on-chip capacitor was different from the case of without on-chip capacitor. The current flow at the power and ground terminals was used as excitation source of FDTD model with the power/ ground plane. The simulation results were compared with the measurement data.",

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AB - This paper reports simulation results on simultaneous switching noise and radiated emission due to the existence of on-chip decoupling capacitor. Signal overshoots/undershoots was observed for the case of on-chip decoupling capacitor, while signal degradation was observed for the case of without on-chip decoupling capacitor. The behavior of ground bounce for the case of on-chip capacitor was different from the case of without on-chip capacitor. The current flow at the power and ground terminals was used as excitation source of FDTD model with the power/ ground plane. The simulation results were compared with the measurement data.

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Simulation of reduction properties of radiated emission by on-chip decoupling capacitor

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