Small Signal Characteristics of n+Ge Gate AlGaAs/GaAs MISFETs

Shiuichi Fujita, Makoto Hirano, Koichi Maezawa, Takashi Mizutani

Research output: Contribution to journal › Article › peer-review

Original language	English
Pages (from-to)	518-520
Journal	IEEE Electron Device Letters
Volume	EDL-9
Publication status	Published - 1988 Apr 1

Cite this

@article{85174d629a41466d882d3ad3059733bf,

title = "Small Signal Characteristics of n+Ge Gate AlGaAs/GaAs MISFETs",

author = "Shiuichi Fujita and Makoto Hirano and Koichi Maezawa and Takashi Mizutani",

year = "1988",

month = apr,

day = "1",

language = "English",

volume = "EDL-9",

pages = "518--520",

journal = "IEEE Electron Device Letters",

issn = "0741-3106",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

}