Study of cross-sections of magnetite thin films by means of electron backscatter diffraction (EBSD)

A. Koblischka-Veneva; M. R. Koblischka; F. Mücklich; U. Hartmann

doi:10.1002/pssa.200723634

Study of cross-sections of magnetite thin films by means of electron backscatter diffraction (EBSD)

A. Koblischka-Veneva, M. R. Koblischka, F. Mücklich, U. Hartmann

Research output: Contribution to journal › Article › peer-review

1 Citation (Scopus)

Abstract

By means of electron backscatter diffraction (EBSD), we studied the grain orientation of cross-sections of magnetite (Fe ₃O ₄) thin films grown on (001) oriented MgO substrates. Earlier studies showed that the magnetic properties of the magnetite films are dominated by the presence of so-called anti-phase boundaries (APBs). The use of cross-sections of thin-films enables to study the growth mechanism in a more direct way. The EBSD maps reveal that the first magnetite layer on the MgO substrate is comprised of many small, misoriented magnetite grains. Subsequent layers show the desired (001) orientation with a ±5° misorientation. The misorientations found in the cross-section of the film resemble those obtained in EBSD measurements at the sample surface.

Original language	English
Pages (from-to)	1835-1838
Number of pages	4
Journal	Physica Status Solidi (A) Applications and Materials Science
Volume	205
Issue number	8
DOIs	https://doi.org/10.1002/pssa.200723634
Publication status	Published - 2008 Aug 1
Externally published	Yes

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Condensed Matter Physics
Surfaces and Interfaces
Surfaces, Coatings and Films
Electrical and Electronic Engineering
Materials Chemistry

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title = "Study of cross-sections of magnetite thin films by means of electron backscatter diffraction (EBSD)",

abstract = "By means of electron backscatter diffraction (EBSD), we studied the grain orientation of cross-sections of magnetite (Fe 3O 4) thin films grown on (001) oriented MgO substrates. Earlier studies showed that the magnetic properties of the magnetite films are dominated by the presence of so-called anti-phase boundaries (APBs). The use of cross-sections of thin-films enables to study the growth mechanism in a more direct way. The EBSD maps reveal that the first magnetite layer on the MgO substrate is comprised of many small, misoriented magnetite grains. Subsequent layers show the desired (001) orientation with a ±5° misorientation. The misorientations found in the cross-section of the film resemble those obtained in EBSD measurements at the sample surface.",

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T1 - Study of cross-sections of magnetite thin films by means of electron backscatter diffraction (EBSD)

AU - Koblischka-Veneva, A.

AU - Koblischka, M. R.

AU - Mücklich, F.

AU - Hartmann, U.

PY - 2008/8/1

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N2 - By means of electron backscatter diffraction (EBSD), we studied the grain orientation of cross-sections of magnetite (Fe 3O 4) thin films grown on (001) oriented MgO substrates. Earlier studies showed that the magnetic properties of the magnetite films are dominated by the presence of so-called anti-phase boundaries (APBs). The use of cross-sections of thin-films enables to study the growth mechanism in a more direct way. The EBSD maps reveal that the first magnetite layer on the MgO substrate is comprised of many small, misoriented magnetite grains. Subsequent layers show the desired (001) orientation with a ±5° misorientation. The misorientations found in the cross-section of the film resemble those obtained in EBSD measurements at the sample surface.

AB - By means of electron backscatter diffraction (EBSD), we studied the grain orientation of cross-sections of magnetite (Fe 3O 4) thin films grown on (001) oriented MgO substrates. Earlier studies showed that the magnetic properties of the magnetite films are dominated by the presence of so-called anti-phase boundaries (APBs). The use of cross-sections of thin-films enables to study the growth mechanism in a more direct way. The EBSD maps reveal that the first magnetite layer on the MgO substrate is comprised of many small, misoriented magnetite grains. Subsequent layers show the desired (001) orientation with a ±5° misorientation. The misorientations found in the cross-section of the film resemble those obtained in EBSD measurements at the sample surface.

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Study of cross-sections of magnetite thin films by means of electron backscatter diffraction (EBSD)

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