TEM and electron backscatter diffraction analysis (EBSD) on superconducting nanowires

A. Koblischka-Veneva, M. R. Koblischka, X. L. Zeng, J. Schmauch, U. Hartmann

Research output: Contribution to journalConference articlepeer-review

12 Citations (Scopus)


Electrospun, superconducting nanowires are characterized concerning the grain orientation, their texture and the respective grain boundary misorientations by means of electron backscatter diffraction (EBSD) analysis. The individual nanowires in such electrospun, nonwoven nanowire networks of Bi2Sr2CaCu2O x (Bi-2212) are polycrystalline, have average diameters up to 250 nm and their grains are in the 20-50 nm range. This requires a high spatial resolution for the analysis in the scanning electron microscope. However, the small diameter of the nanowires enables the application of the newly developed transmission EBSD (t-EBSD) technique without the preparation of TEM slices. Here, we present TEM images of individual nanowires and several EBSD mappings on Bi-2212 nanowires and compare their microstructure to those of filaments of the first generation tapes.

Original languageEnglish
Article number012005
JournalJournal of Physics: Conference Series
Issue number1
Publication statusPublished - 2018 Jul 26
Externally publishedYes
Event30th International Symposium on Superconductivity, ISS 2017 - Tokyo, Japan
Duration: 2017 Dec 132017 Dec 15

ASJC Scopus subject areas

  • General Physics and Astronomy


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