Abstract
We have conducted transmission electron microscopic observations along the [001] direction of the interfaces between Y2BaCuO5inclusions and the YBa2Cu3O7matrix in the YBaCuO crystals fabricated by the Melt-Powder-Melt-Growth process. Amorphous layers about 1 nm in thickness are observed at some interfaces. We could not find observable crystallographic defects at the interfaces.
Original language | English |
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Pages (from-to) | L1428-L1431 |
Journal | Japanese Journal of Applied Physics |
Volume | 29 |
Issue number | 8 |
DOIs | |
Publication status | Published - 1990 Aug |
Externally published | Yes |
Keywords
- Interface
- Melt-Powder-Meit-Growth process
- Transmission electron microscopy
- YBaCuO
- YbaCuO
ASJC Scopus subject areas
- Engineering(all)
- Physics and Astronomy(all)