Texture analysis of melt-spun Ni-Mn-Ga tapes by means of electron backscatter diffraction (EBSD)

A. Koblischka-Veneva, M. R. Koblischka, J. Schmauch, A. Mitra, A. K. Panda

Research output: Contribution to journal › Conference article › peer-review

5 Citations (Scopus)

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Physics & Astronomy